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Physical and technical foundations development of signal processing devices barrier micro- and nanostructures

Physical and technical foundations development of signal processing devices barrier micro- and nanostructures

The developed method of input impedance characteristics allows to obtain new knowledge about the wave properties of barrier micro- and nanostructures and, on this basis, new effective technical solutions. As an impedance-based method, it is universal for wave structures of any nature. The proposed and developed method of impedance -inhomogeneities combines the advantages of impedance approach and locally lumped properties of -function. For many structures solutions are analytical.