Research methods development and definitions of the microwave characteristics of the latest isotropic and anisotropic materials and nanoscale films
Detailed test method developed thin dielectric resonator shown its advantages and suitability for study of the dielectric properties of anisotropic materials in thin layers. Very thin dielectric substrate, 0.1 mm thick with a dielectric constant ε > 10 can successfully act as a dielectric resonator (DR) and used for the measurement of microwave parameters of the materials by studying the spectra of thin DR.